Method, system, and computer program product for improved electrical analysis
US8386975B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 26, 2008 |
| Grant date | Feb 26, 2013 |
| Priority date | — |
| Expiry date | Feb 17, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F30/367
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
An improved method, system, user interface, and computer program product is described for using a memory and learning component to improve capacitance and resistance estimates based on the types of layouts and devices being evaluated. According to some approaches, a learning component is implemented that uses recommended test sets from the evaluation component to automatically test the extraction estimates against the field solver. Variability models from manufacturing or electrical analysis may also be used to select a series of objects (unique conductor geometries) that make up a conduction path or net or specific conductor geometries for evaluation and additional learning improvement.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.