David White
57Patents
22h-index
40Co-inventors
84Inventor score
Filing activity: Jun 7, 2002 → Jul 30, 2020
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7383521B2 | Characterization and reduction of variation for integrated circuits | Physics | 325 | Expired |
| US7124386B2 | Dummy fill for integrated circuits | Electricity | 290 | Expired |
| US7174520B2 | Characterization and verification for integrated circuit designs | Electricity | 287 | Expired |
| US7152215B2 | Dummy fill for integrated circuits | Emerging Cross-Sectional Technologies | 273 | Expired |
| US7367008B2 | Adjustment of masks for integrated circuit fabrication | Electricity | 235 | Expired |
| US7360179B2 | Use of models in integrated circuit fabrication | Emerging Cross-Sectional Technologies | 222 | Expired |
| US7243316B2 | Test masks for lithographic and etch processes | Electricity | 218 | Expired |
| US7962867B2 | Electronic design for integrated circuits based on process related variations | Electricity | 199 | Active |
| US7712056B2 | Characterization and verification for integrated circuit designs | Physics | 183 | Active |
| US8001516B2 | Characterization and reduction of variation for integrated circuits | Physics | 116 | Active |
| US8435268B2 | Systems, devices and methods for the correction of spinal deformities | Human Necessities | 108 | Active |
| US7393755B2 | Dummy fill for integrated circuits | Emerging Cross-Sectional Technologies | 86 | Expired |
| US8001512B1 | Method and system for implementing context simulation | Emerging Cross-Sectional Technologies | 51 | Active |
| US7353475B2 | Electronic design for integrated circuits based on process related variations | Electricity | 44 | Expired |
| US7363099B2 | Integrated circuit metrology | Electricity | 41 | Expired |
| US8419772B2 | Systems, methods and devices for correcting spinal deformities | Human Necessities | 39 | Active |
| US7325206B2 | Electronic design for integrated circuits based process related variations | Electricity | 38 | Expired |
| US7356783B2 | Dummy fill for integrated circuits | Emerging Cross-Sectional Technologies | 31 | Expired |
| US7380220B2 | Dummy fill for integrated circuits | Emerging Cross-Sectional Technologies | 29 | Expired |
| US7689948B1 | System and method for model-based scoring and yield prediction | Emerging Cross-Sectional Technologies | 27 | Active |
| US9534547B2 | Airflow control systems and methods | Emerging Cross-Sectional Technologies | 26 | Active |
| US7363598B2 | Dummy fill for integrated circuits | Emerging Cross-Sectional Technologies | 26 | Expired |
| US7725845B1 | System and method for layout optimization using model-based verification | Emerging Cross-Sectional Technologies | 22 | Active |
| US7707528B1 | System and method for performing verification based upon both rules and models | Emerging Cross-Sectional Technologies | 22 | Active |
| US8782577B2 | Method, apparatus, and article of manufacture for providing in situ, customizable information in designing electronic circuits with electrical awareness | Physics | 19 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.