Method and system for subnet defect diagnostics through fault compositing
US8402421B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 12, 2010 |
| Grant date | Mar 19, 2013 |
| Priority date | — |
| Expiry date | Nov 19, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/2205
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method and system for subnet defect diagnostics through fault compositing is disclosed. A testing apparatus generates callout data for an integrated circuit device under test. A computer received the callout data, which includes a list of faults. Each fault of the list of faults has associated with it one or more failures and/or conflicts. In order to explain the failures, two or more faults are selected and composited, yielding a composite fault having a composite conflict count. The composite fault is assigned a score based on the composite conflict count, which score determines a candidate composite that best explains the faults of the list of faults. This procedure may be repeated to explain all the failures.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.