Patent · US Active

Device and method for evaluating a temperature

US8430562B2 · kind B2 · utility

0Cited by
4References
20Claims
0Family size

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Inventors

Key dates

Filing dateNov 8, 2011
Grant dateApr 30, 2013
Priority date
Expiry dateNov 8, 2031

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01K7/346
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method for evaluating temperature is disclosed. The method includes setting a configuration of a configurable delay line out of multiple possible configurations, and delaying a first input signal by a temperature sensitive delay line, delaying a second input signal by the configurable delay line. The configurable delay line is less sensitive to temperature than the temperature sensitive delay line. The method also includes detecting, by a phase detector, a delay difference between a delay introduced by the temperature sensitive delay line and a delay introduced by the configurable delay line, repeating the setting, delaying of the first input signal, delaying of the second input signal and detecting, until the delay difference is below a threshold, and evaluating the temperature of the temperature sensitive delay line in response to a configuration of the configurable delay line that results in the delay difference that is below the threshold.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.