Patent · US Active

Measuring probe device for a probe microscope, measuring cell and scanning probe microscope

US8505109B2 · kind B2 · utility

0Cited by

4References

13Claims

0Family size

Assignee

JPK INSTRUMENTS AG · DE

Inventors

Torsten Jähnke · Berlin, DE
Torsten Müller · Berlin, DE
Kathryn Anne Poole · Berlin, DE
Detlef Knebel · Berlin, DE

Key dates

Filing date	Jul 24, 2008
Grant date	Aug 6, 2013
Priority date	—
Expiry date	Dec 16, 2029

Classification

Technology area (CPC B)Performing Operations; Transporting
CPC primaryB01L2300/10
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

The invention relates to a measuring probe device for a probe microscope, in particular a scanning probe microscope, with a measuring probe holder and a measuring probe arranged on the measuring probe holder, which is set up for a probe microscopic investigation of a sample, wherein on the measuring probe holder, a measuring probe chamber is formed, which receives the measuring probe at least partially and is open on a side away from the measuring probe holder, and is configured to receive a liquid surrounding the measuring probe. The invention also relates to a measuring cell for receiving a liquid sample for a probe microscope, a scanning probe microscope with a measuring probe device and a scanning probe microscope with a measuring cell.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.