Patent · US Active

Plasma-activated deposition of conformal films

US8524612B2 · kind B2 · utility

378Cited by
65References
18Claims
0Family size

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Key dates

Filing dateJan 21, 2011
Grant dateSep 3, 2013
Priority date
Expiry dateJan 21, 2031

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/76898
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

Embodiments related to depositing thin conformal films using plasma-activated conformal film deposition (CFD) processes are described herein. In one example, a method of processing a substrate includes, applying photoresist to the substrate, exposing the photoresist to light via a stepper, patterning the resist with a pattern and transferring the pattern to the substrate, selectively removing photoresist from the substrate, placing the substrate into a process station, and, in the process station, in a first phase, generating radicals off of the substrate and adsorbing the radicals to the substrate to form active species, in a first purge phase, purging the process station, in a second phase, supplying a reactive plasma to the surface, the reactive plasma configured to react with the active species and generate the film, and in a second purge phase, purging the process station.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.