Patent · US Active

Plasma processing apparatus

US8545672B2 · kind B2 · utility

0Cited by
3References
4Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 7, 2011
Grant dateOct 1, 2013
Priority date
Expiry dateNov 7, 2031

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/6831
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

The plasma processing apparatus includes: a processing chamber an inside of which is airtightly closable; a process gas supplying mechanism which supplies a process gas into the processing chamber; an exhaust mechanism which evacuates the inside of the processing chamber; a plasma generating mechanism which generates plasma from the process gas; a holding stage which is provided in the processing chamber and configured such that a substrate to be processed and a focus ring provided to surround the substrate to be processed are held on a same plane; a temperature control mechanism which adjusts a temperature of the holding stage; and an electrostatic chuck which is provided on a top surface of the holding stage and comprises an adsorbing electrode extending to a portion under the focus ring.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.