Reliability and performance of a system-on-a-chip by predictive wear-out based activation of functional components
US8549363B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 19, 2010 |
| Grant date | Oct 1, 2013 |
| Priority date | — |
| Expiry date | Jun 3, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31725
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A processor-implemented method for determining aging of a processing unit in a processor the method comprising: calculating an effective aging profile for the processing unit wherein the effective aging profile quantifies the effects of aging on the processing unit; combining the effective aging profile with process variation data, actual workload data and operating conditions data for the processing unit; and determining aging through an aging sensor of the processing unit using the effective aging profile, the process variation data, the actual workload data, architectural characteristics and redundancy data, and the operating conditions data for the processing unit.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.