ATPG and compression by using majority gates
US8549372B2 · kind B2 · utility
1Cited by
1References
26Claims
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Key dates
| Filing date | Mar 5, 2012 |
| Grant date | Oct 1, 2013 |
| Priority date | — |
| Expiry date | Mar 8, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/318357
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method to increase automatic test pattern generation (ATPG) effectiveness and compression identifies instances of “majority gates” and modifies test generation to exploit their behavior so that fewer care bit are needed. This method can increase test coverage and reduce CPU time as previously aborted faults are now tested. The majority gate enhanced ATPG requires no hardware support and can be applied to any ATPG system.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.