Temperature based compensation during verify operations for non-volatile storage
US8582381B2 · kind B2 · utility
15Cited by
13References
16Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Feb 23, 2012 |
| Grant date | Nov 12, 2013 |
| Priority date | — |
| Expiry date | May 27, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C16/3481
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A non-volatile storage system that performs programming and reading processes. The programming process includes coarse/fine programming and verify operations. Programming is verified by testing for two different threshold voltage levels while applying the same voltage level to the control gate of a memory cell by testing for current levels through the memory cells and adjusting the current levels tested for based on current temperature such that the difference between the two effective tested threshold voltage levels remains constant over temperature variation.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.