Semiconductor device with DRAM bit lines made from same material as gate electrodes in non-memory regions of the device, and methods of making same
US8609457B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 3, 2011 |
| Grant date | Dec 17, 2013 |
| Priority date | — |
| Expiry date | Oct 31, 2031 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10B12/482
Abstract
Generally, the present disclosure is directed to a semiconductor device with DRAM bit lines made from the same material as the gate electrodes in non-memory regions of the device, and methods of making the same. One illustrative method disclosed herein comprises forming a semiconductor device including a memory array and a logic region. The method further comprises forming a buried word line in the memory array and, after forming the buried word line, performing a first common process operation to form at least a portion of a conductive gate electrode in the logic region and to form at least a portion of a conductive bit line in the memory array.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.