Physically unclonable function implemented through threshold voltage comparison
US8619979B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 25, 2010 |
| Grant date | Dec 31, 2013 |
| Priority date | — |
| Expiry date | Jan 30, 2032 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04L9/0866
- WIPO fieldDigital communication
- WIPO sectorElectrical engineering
Abstract
Electronic devices and methods are disclosed to provide and to test a physically unclonable function (PUF) based on relative threshold voltages of one or more pairs of transistors. In a particular embodiment, an electronic device is operable to generate a response to a challenge. The electronic device includes a plurality of transistors, with each of the plurality of transistors having a threshold voltage substantially equal to an intended threshold voltage. The electronic device includes a challenge input configured to receive the challenge. The challenge input includes one or more bits that are used to individually select each of a pair of transistors of the plurality of transistors. The electronic device also includes a comparator to receive an output voltage from each of the pair of transistors and to generate a response indicating which of the pair of transistors has the higher output voltage. The output voltage of each of the pair of transistors varies based on the threshold voltage of each of the pair of transistors.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.