Patent · US Active

Methods of programming and erasing programmable metallization cells (PMCs)

US8625331B1 · kind B1 · utility

10Cited by
10References
18Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 10, 2012
Grant dateJan 7, 2014
Priority date
Expiry dateJul 10, 2032

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C2213/82
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

An integrated circuit can include a plurality of programmable metallization cells (PMCs) in a memory array, each PMC comprising an ion conducting material, an active metal dissolvable in the ion conducting material, and two electrodes, a first electrode of at least one PMC being coupled to a program node; and a plurality of program and verify circuits, each including a current source section to enable at least one current path between the program node and a power supply node in a program and verify operation, and a verify signal generator circuit comprising at least a first comparator having a first input coupled to the program node, a second input coupled to receive a first reference voltage, and a comparator output to provide a verify signal that indicates a program operation is complete.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.