Patent · US Active

Fully X-tolerant, very high scan compression scan test systems and techniques

US8645780B2 · kind B2 · utility

4Cited by

11References

7Claims

0Family size

Assignee

SYNOPSYS, INC. · US

Inventors

Peter Wohl · Williston, US
John A. Waicukauski · Tualatin, US
Frederic J. Neuveux · Meylan, FR

Key dates

Filing date	Jun 5, 2013
Grant date	Feb 4, 2014
Priority date	—
Expiry date	Jun 5, 2033

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/318547
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

Scan testing and scan compression are key to realizing cost reduction and shipped quality. New defect types in ever more complex designs require increased compression. However, increased density of unknown (X) values reduces effective compression. A scan compression method can achieve very high compression and full coverage for any density of unknown values. The described techniques can be fully integrated in the design-for-test (DFT) and automatic test pattern generation (ATPG) flows. Results from using these techniques on industrial designs demonstrate consistent and predictable advantages over other methods.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.