Patent · US Active

Progressive trimming method

US8679944B2 · kind B2 · utility

11Cited by
21References
17Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 31, 2009
Grant dateMar 25, 2014
Priority date
Expiry dateJan 31, 2030

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/0002
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

The invention provides a method of trimming a structure that includes a first wafer bonded to a second wafer, with the first wafer having a chamfered edge. The method includes a first trimming step carried out over a first depth that includes at least the thickness of the first wafer and over a first width determined from the edge of the first wafer. A second trimming step is then carried out over a second depth that includes at least the thickness of the first wafer and over a second width that is less than the first width.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.