Low leakage current operation of integrated circuit using scan chain
US8689068B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 28, 2011 |
| Grant date | Apr 1, 2014 |
| Priority date | — |
| Expiry date | Jun 15, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/318575
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An integrated circuit (IC) having a low leakage current mode of operation has a number of modules for running respective applications. The modules have respective cells and respective test scan chain elements. The IC also has a controller for configuring an active module to operate in a functional mode and a selected inactive module to operate in a low leakage current mode. Configuring the selected inactive module to operate in low leakage current mode includes enabling scan mode of the selected inactive module, and applying a low leakage vector of input signals from the controller to the cells of the inactive module using the scan chain. Functional data outputs of the inactive module are disabled during low leakage current mode. In the meantime, the active modules continue to operate in the functional mode.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.