Probe card for testing high-frequency signals
US8692570B2 · kind B2 · utility
1Cited by
4References
9Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | May 11, 2011 |
| Grant date | Apr 8, 2014 |
| Priority date | — |
| Expiry date | Jun 25, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/06727
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A probe card includes a circuit board, a flexible substrate, and a plurality of probes. The flexible substrate includes a plurality of arrayed conductive strips. The plurality of conductive strips is electrically connected to the printed circuit board. The plurality of probes is fixed to the printed circuit board, and the end of each probe is attached to one corresponding conductive strip.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.