Chih-Kun Chen
19Patents
4h-index
18Co-inventors
53Inventor score
Filing activity: Dec 28, 2001 → Nov 18, 2020
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6726554B1 | Guide ring removal device | Emerging Cross-Sectional Technologies | 15 | Expired |
| US6932094B2 | Slurry tank autocleaner | Performing Operations; Transporting | 10 | Expired |
| US6923709B2 | Chemical mechanical polishing apparatus having a measuring device for measuring a guide ring | Performing Operations; Transporting | 7 | Expired |
| US6834547B2 | Humidity sensor and fabrication method thereof | Physics | 5 | Expired |
| US6790010B2 | Switching system for a reciprocating piston pump | Mechanical Engineering; Lighting; Heating | 4 | Expired |
| US6671576B1 | Wafer carrier | Emerging Cross-Sectional Technologies | 4 | Expired |
| US7091868B2 | Portable liquid level detector | Physics | 4 | Expired |
| US7252099B2 | Wafer cleaning apparatus with multiple wash-heads | Emerging Cross-Sectional Technologies | 3 | Expired |
| US11309646B2 | Electrical connector having terminals with reduced height | Electricity | 2 | Active |
| US10998662B2 | Electrical connector | Electricity | 2 | Active |
| US6941811B2 | Method and apparatus for detecting wafer flaw | Physics | 2 | Expired |
| US6743081B2 | In-line oscillating device | Emerging Cross-Sectional Technologies | 1 | Expired |
| US8692570B2 | Probe card for testing high-frequency signals | Physics | 1 | Active |
| US6745631B2 | Method of measuring pore depth on the surface of a polishing pad | Physics | 0 | Expired |
| US11303072B2 | Electrical connector and electrical connector assembly | Electricity | 0 | Active |
| US11146007B2 | Electrical connector and method for manufacturing the same | Electricity | 0 | Active |
| US11469533B2 | Electrical terminal and electrical connector in vertical compression contact with chip module | Electricity | 0 | Active |
| US6719617B2 | Slurry homogenizer and supply system | Performing Operations; Transporting | 0 | Expired |
| US6920796B2 | Device used for detecting clamping force of processed object and method thereof | Electricity | 0 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.