Patent · US Active

Film deposition apparatus and film deposition method

US8696814B2 · kind B2 · utility

3Cited by
38References
12Claims
0Family size

Assignees

Inventors

Key dates

Filing dateNov 29, 2007
Grant dateApr 15, 2014
Priority date
Expiry dateApr 17, 2029

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D30/0291
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A disclosed film deposition apparatus includes a process chamber inside which a reduced pressure space is maintained; a gas supplying portion that supplies a film deposition gas to the process chamber; a substrate holding portion that is made of a material including carbon as a primary constituent and holds a substrate in the process chamber; a coil that is arranged outside the process chamber and inductively heats the substrate holding portion; and a thermal insulation member that covers the substrate holding portion and is arranged to be separated from the process chamber, wherein the reduced pressure space is separated into a film deposition gas supplying space to which the film deposition gas is supplied and a thermal insulation space defined between the substrate holding portion and the process chamber, and wherein a cooling medium is supplied to the thermal insulation space.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.