Metrology system for imaging workpiece surfaces at high robot transfer speeds
US8698889B2 · kind B2 · utility
2Cited by
1References
22Claims
0Family size
Assignee
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Key dates
| Filing date | Feb 17, 2010 |
| Grant date | Apr 15, 2014 |
| Priority date | — |
| Expiry date | Mar 11, 2032 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S901/47
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A metrology system has an elongate stationary camera pixel array facing a workpiece transit path of a robot with an field of view corresponding to a workpiece diameter and extending transverse to the transit path portion, and a stationary elongate light emitting array generally parallel to the pixel array. An image control processor causes the camera to capture successive image frames while the robot is moving the workpiece through the transit path.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.