Microscopy method and microscope with enhanced resolution

US8705172B2 · kind B2 · utility

Assignee

• Carl Zeiss Microscopy GmbH · DE

Inventors

• Ingo Kleppe · Jena, DE
• Ralf Netz · Jena, DE
• Yauheni Novikau · Jena, DE

Key dates

• Filing date: Oct 27, 2010
• Grant date: Apr 22, 2014
• Expiry date: Apr 24, 2032

Classification

• Technology area (CPC G): Physics
• CPC primary: G02B21/008
• WIPO field: Optics
• WIPO sector: Instruments

Abstract

Method for enhancing the resolution of a microscope during the detection of an illuminated specimen and a microscope for carrying out the method, wherein in a first position, an illumination pattern is generated on the specimen, the resolution of which is preferably within the range of the attainable optical resolution of the microscope or higher, wherein a relative movement, preferably perpendicular to the direction of illumination, from a first into at least one second position of the illumination pattern on the specimen is generated at least once between the detection and the illumination pattern with a step width smaller than the resolution limit of the microscope and detection and storage of the detection signals take place both in the first and in the second position.