Semiconductor device comprising self-aligned contact elements and a replacement gate electrode structure
US8722523B2 · kind B2 · utility
11Cited by
5References
23Claims
0Family size
Assignee
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Key dates
| Filing date | Feb 10, 2012 |
| Grant date | May 13, 2014 |
| Priority date | — |
| Expiry date | Mar 1, 2032 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10D84/038
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
When forming sophisticated semiconductor devices including high-k metal gate electrode structures, a raised drain and source configuration may be used for controlling the height upon performing a replacement gate approach, thereby providing superior conditions for forming contact elements and also obtaining a well-controllable reduced gate height.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.