Patent · US Active

Plasma processing apparatus and plasma processing method

US8741097B2 · kind B2 · utility

5Cited by
14References
11Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 27, 2010
Grant dateJun 3, 2014
Priority date
Expiry dateNov 3, 2031

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/6831
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

A plasma processing apparatus includes a processing chamber including a dielectric window; a coil-shaped RF antenna, provided outside the dielectric window; a substrate supporting unit provided in the processing chamber; a processing gas supply unit; an RF power supply unit for supplying an RF power to the RF antenna to generate a plasma of the processing gas by an inductive coupling in the processing chamber, the RF power having an appropriate frequency for RF discharge of the processing gas; a correction coil, provided at a position outside the processing chamber where the correction coil is to be coupled with the RF antenna by an electromagnetic induction, for controlling a plasma density distribution on the substrate in the processing chamber; a switching device provided in a loop of the correction coil; and a switching control unit for on-off controlling the switching device at a desired duty ratio by pulse width modulation.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.