Patent · US Active

Plasma processing apparatus and plasma processing method

US8741779B2 · kind B2 · utility

0Cited by
29References
16Claims
0Family size

Assignees

Inventors

Key dates

Filing dateJul 17, 2013
Grant dateJun 3, 2014
Priority date
Expiry dateJul 17, 2033

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/67069
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A plasma processing apparatus for processing an object to be processed using a plasma. The apparatus includes a processing chamber defining a processing cavity for containing an object to be processed and a process gas therein, a microwave radiating antenna having a microwave radiating surface for radiating a microwave in order to excite a plasma in the processing cavity, and a dielectric body provided so as to be opposed to the microwave radiating surface, in which the distance D between the microwave radiating surface and a surface of the dielectric body facing away from the microwave radiating surface, which is represented with the wavelength of the microwave being a distance unit, is determined to be in the range satisfying the inequality0.7×n/4≦D≦1.3×n/4 (n being a natural number).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.