Patent · US Active

Method and system for fabricating floating guard rings in GaN materials

US8749015B2 · kind B2 · utility

5Cited by
0References
11Claims
0Family size

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Key dates

Filing dateNov 17, 2011
Grant dateJun 10, 2014
Priority date
Expiry dateMar 22, 2032

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D64/111
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method for fabricating an edge termination structure includes providing a substrate having a first surface and a second surface and a first conductivity type, forming a first GaN epitaxial layer of the first conductivity type coupled to the first surface of the substrate, and forming a second GaN epitaxial layer of a second conductivity type opposite to the first conductivity type. The second GaN epitaxial layer is coupled to the first GaN epitaxial layer. The method also includes implanting ions into a first region of the second GaN epitaxial layer to electrically isolate a second region of the second GaN epitaxial layer from a third region of the second GaN epitaxial layer. The method further includes forming an active device coupled to the second region of the second GaN epitaxial layer and forming the edge termination structure coupled to the third region of the second GaN epitaxial layer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.