Patent · US Active

Mask set for double exposure process and method of using the mask set

US8778604B2 · kind B2 · utility

3Cited by
6References
8Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 24, 2012
Grant dateJul 15, 2014
Priority date
Expiry dateJun 15, 2032

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG03F7/70466
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

A mask set for double exposure process and method of using said mask set. The mask set is provided with a first mask pattern having a first base and a plurality of first teeth and protruding portions, and a second mask pattern having a second base and a plurality of second teeth, wherein the second base may at least partially overlap the first base such that each of the protruding portions at least partially overlaps one of the second teeth.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.