Patent · US Active

Vertical mirror in a silicon photonic circuit

US8803268B2 · kind B2 · utility

4Cited by
2References
7Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 26, 2013
Grant dateAug 12, 2014
Priority date
Expiry dateApr 26, 2033

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG02B6/4214
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

A vertical total internal reflection (TIR) mirror and fabrication thereof is made by creating a re-entrant profile using crystallographic silicon etching. Starting with an SOI wafer, a deep silicon etch is used to expose the buried oxide layer, which is then wet-etched (in HF), opening the bottom surface of the Si device layer. This bottom silicon surface is then exposed so that in a crystallographic etch, the resulting shape is a re-entrant trapezoid with facets These facets can be used in conjunction with planar silicon waveguides to reflect the light upwards based on the TIR principle. Alternately, light can be coupled into the silicon waveguides from above the wafer for such purposes as wafer level testing.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.