Determining system lifetime characteristics
US8804428B2 · kind B2 · utility
5Cited by
6References
32Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Aug 16, 2011 |
| Grant date | Aug 12, 2014 |
| Priority date | — |
| Expiry date | Jul 27, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C29/028
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The present disclosure includes methods and systems for determining system lifetime characteristics. A number of embodiments include a number of memory devices and a controller coupled to the number of memory devices. The controller can be configured to perform a number of operations on the number of memory devices using a number of trim parameters at a testing level, and determine a system lifetime characteristic based, at least partially, on the number of operations performed on the number of memory devices using the number of trim parameters at the testing level.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.