Systems and methods for simultaneous optical testing of a plurality of devices under test
US8823406B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 17, 2011 |
| Grant date | Sep 2, 2014 |
| Priority date | — |
| Expiry date | Jun 13, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2635
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Systems and methods for simultaneous optical testing of a plurality of devices under test. These systems and methods may include the use of an optical probe assembly that includes a power supply structure that is configured to provide an electric current to a plurality of devices under test (DUTs) and an optical collection structure that is configured to simultaneously collect electromagnetic radiation that may be produced by the plurality of DUTs and to provide the collected electromagnetic radiation to one or more optical detection devices. The systems and methods also may include the use of the optical probe assembly in an optical probe system to evaluate one or more performance parameters of each of the plurality of DUTs.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.