Imaging a sample in a TEM equipped with a phase plate
US8835846B2 · kind B2 · utility
3Cited by
6References
20Claims
0Family size
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Key dates
| Filing date | Aug 30, 2013 |
| Grant date | Sep 16, 2014 |
| Priority date | — |
| Expiry date | Aug 30, 2033 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J2237/2614
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
The invention relates to a method of forming an image of a sample in a transmission electron microscope equipped with a phase plate. Prior art use of such a phase plate can introduce artifacts in the form of ringing and a halo. These artifacts are caused by the abrupt changes in the Fourier domain due to the sharp edges of the phase plate in the diffraction plane. By moving the phase plate with respect to the non-diffraction beam (the diffraction pattern) while recording an image the sudden transition in the Fourier domain is changed to a more gradual transition, resulting in less artifacts.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.