Patent · US Active

Method for designing optical lithography masks for directed self-assembly

US8856693B2 · kind B2 · utility

10Cited by
13References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 7, 2012
Grant dateOct 7, 2014
Priority date
Expiry dateDec 14, 2032

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG03F7/0002
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

A method and a computer system for designing an optical photomask for forming a prepattern opening in a photoresist layer on a substrate wherein the photoresist layer and the prepattern opening are coated with a self-assembly material that undergoes directed self-assembly to form a directed self-assembly pattern. The methods includes: generating a mask design shape from a target design shape; generating a sub-resolution assist feature design shape based on the mask design shape; using a computer to generate a prepattern shape based on the sub-resolution assist feature design shape; and using a computer to evaluate if a directed self-assembly pattern of the self-assembly material based on the prepattern shape is within specified ranges of dimensional and positional targets of the target design shape on the substrate.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.