Patent · US Active

Methods and apparatuses for master-slave detection

US8862863B2 · kind B2 · utility

1Cited by

4References

20Claims

0Family size

Assignee

Micron Technology, Inc. · US

Inventors

Kang-Yong Kim · Boise, US
Jacob Anderson · Meridian, US
Huy T. Vo · Boise, US

Key dates

Filing date	Jul 25, 2013
Grant date	Oct 14, 2014
Priority date	—
Expiry date	Jul 25, 2033

Classification

Technology area (CPC G)Physics
CPC primaryG11C2029/0407
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

Apparatuses, master-slave detect circuits, memories, and methods are disclosed. One such method includes performing a master detect phase during which a memory unit in a memory group is determined to be a master memory unit, determining at each memory unit its location relative to other memory units, and determining at each memory unit its location in the memory group based on a total number of slave memory units and its location relative to other memory units.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.