Huy T. Vo
77Patents
16h-index
55Co-inventors
87Inventor score
Filing activity: Oct 11, 1990 → Oct 27, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6166942A | Embedded DRAM architecture with local data drivers and programmable number of data read and data write lines | Physics | 452 | Expired |
| US5097381A | Double sidewall trench capacitor cell | Electricity | 53 | Expired |
| US6072737A | Method and apparatus for testing embedded DRAM | Physics | 42 | Expired |
| US6141286A | Embedded DRAM architecture with local data drivers and programmable number of data read and data write lines | Physics | 41 | Expired |
| US6496027B1 | System for testing integrated circuit devices | Physics | 32 | Expired |
| US6005813A | Device and method for repairing a semiconductor memory | Physics | 32 | Expired |
| US5719890A | Method and circuit for transferring data with dynamic parity generation and checking scheme in multi-port DRAM | Electricity | 30 | Expired |
| US5778007A | Method and circuit for transferring data with dynamic parity generation and checking scheme in multi-port DRAM | Electricity | 28 | Expired |
| US5854800A | Method and apparatus for a high speed cyclical redundancy check system | Electricity | 26 | Expired |
| US6077211A | Circuits and methods for selectively coupling redundant elements into an integrated circuit | Physics | 23 | Expired |
| US6484278B1 | Method and apparatus for testing an embedded DRAM | Physics | 23 | Expired |
| US5680595A | Programmable data port clocking system for clocking a plurality of data ports with a plurality of clocking signals in an asynchronous transfer mode system | Electricity | 21 | Expired |
| US6345006B1 | Memory circuit with local isolation and pre-charge circuits | Physics | 18 | Expired |
| US5592488A | Method and apparatus for pipelined multiplexing employing analog delays for a multiport interface | Electricity | 16 | Expired |
| US6809986B2 | System and method for negative word line driver circuit | Physics | 16 | Expired |
| US6930503B2 | System for testing integrated circuit devices | Physics | 16 | Expired |
| US6125067A | Device and method for repairing a semiconductor memory | Physics | 14 | Expired |
| US5663925A | Method and apparatus for timing control in a memory device | Physics | 12 | Expired |
| US5748635A | Multiport datapath system | Electricity | 12 | Expired |
| US8342763B2 | Portable printer with ribbon cartridge retaining feature | Electricity | 12 | Active |
| US6756805B2 | System for testing integrated circuit devices | Physics | 11 | Expired |
| US6434066B1 | Device and method for repairing a semiconductor memory | Physics | 10 | Expired |
| US7570504B2 | Device and method to reduce wordline RC time constant in semiconductor memory devices | Physics | 9 | Expired |
| US5488584A | Circuit and method for externally controlling signal development in a serial access memory | Physics | 9 | Expired |
| US9922686B2 | Apparatuses and methods for performing intra-module databus inversion operations | Physics | 6 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.