Patent · US Active

Determining local voltage in an electronic system

US8866504B2 · kind B2 · utility

1Cited by

3References

14Claims

0Family size

Assignee

International Business Machines Corporation · US

Inventors

Martin Eckert · Metzingen, DE
Roland Frech · Esslingen am Neckar, DE
Otto A. Torreiter · Echterdingen, DE
Dieter Wendel · Schenefeld, DE

Key dates

Filing date	Oct 25, 2011
Grant date	Oct 21, 2014
Priority date	—
Expiry date	Dec 26, 2032

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/31703
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A system for measuring a test voltage level (Vx) in a location within a chip is presented. The system includes an on-chip measurement device with an on-chip comparator and an on-chip storage. The on-chip comparator is configured for comparing the test voltage (Vx) to be measured to a reference voltage (Vref), while the on-chip storage is configured for storing the result of this comparison. The system also includes external (off-chip) equipment for generating the reference voltage (Vref), for generating probe signals for probing the state of the storage and for retrieving the state of said on-chip storage.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.