Inventor · Echterdingen, DE

Otto A. Torreiter

40Patents
5h-index
41Co-inventors
69Inventor score

Filing activity: Oct 23, 1992 → Sep 29, 2023

Most-cited inventions

PatentTitleAreaCited byStatus
US5742616A System and method testing computer memories Physics 50 Expired
US5485473A Method and system for testing an integrated circuit featuring scan design Physics 19 Expired
US6127254A Method and device for precise alignment of semiconductor chips on a substrate Electricity 17 Expired
US5369358A Method of ensuring electrical contact between test probes and chip pads through the use of vibration and nondestructive deformation Physics 8 Expired
US6774656B2 Self-test for leakage current of driver/receiver stages Physics 6 Expired
US6725171B2 Self-test with split, asymmetric controlled driver output stage Physics 5 Expired
US7650554B2 Method and an integrated circuit for performing a test Physics 5 Active
US9217758B2 Ball grid array configuration for reliable testing Physics 5 Active
US8535956B2 Chip attach frame Emerging Cross-Sectional Technologies 4 Active
US9977053B2 Wafer probe alignment Physics 4 Active
US9740813B1 Layout effect characterization for integrated circuits Physics 4 Active
US7636254B2 Wordline booster circuit and method of operating a wordline booster circuit Physics 4 Active
US8010934B2 Method and system for testing bit failures in array elements of an electronic circuit Physics 2 Active
US9401222B1 Determining categories for memory fail conditions Physics 2 Active
US8659310B2 Method and system for performing self-tests in an electronic system Physics 2 Active
US9496188B2 Soldering three dimensional integrated circuits Electricity 2 Active
US7921388B2 Wordline booster design structure and method of operating a wordine booster circuit Physics 2 Active
US9322848B2 Ball grid array configuration for reliable testing Physics 2 Active
US9927463B2 Wafer probe alignment Physics 2 Active
US8866504B2 Determining local voltage in an electronic system Physics 1 Active
US11262381B2 Device for positioning a semiconductor die in a wafer prober Physics 1 Active
US9709625B2 Measuring power consumption in an integrated circuit Physics 1 Active
US10114914B2 Layout effect characterization for integrated circuits Physics 0 Active
US10056346B2 Chip attach frame Emerging Cross-Sectional Technologies 0 Active
US11209479B2 Stressing integrated circuits using a radiation source Electricity 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.