Robust memory link testing using memory controller
US8868992B2 · kind B2 · utility
10Cited by
16References
13Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Dec 31, 2009 |
| Grant date | Oct 21, 2014 |
| Priority date | — |
| Expiry date | Dec 31, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C29/44
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
REUT (Robust Electrical Unified Testing) for memory links is introduced which speeds testing, tool development, and debug. In addition it provides training hooks that have enough performance to be used by BIOS to train parameters and conditions that have not been possible with past implementations. Address pattern generation circuitry is also disclosed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.