Patent · US Active

Method of forming a graphene cap for copper interconnect structures

US8895433B2 · kind B2 · utility

8Cited by
7References
17Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 6, 2014
Grant dateNov 25, 2014
Priority date
Expiry dateJan 6, 2034

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/0002
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

Interconnect structures including a graphene cap located on exposed surfaces of a copper structure are provided. In some embodiments, the graphene cap is located only atop the uppermost surface of the copper structure, while in other embodiments the graphene cap is located along vertical sidewalls and atop the uppermost surface of the copper structure. The copper structure is located within a dielectric material.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.