Patent · US Active

Method and apparatus for the combined analysis of a sample with objects to be analyzed

US8898809B2 · kind B2 · utility

0Cited by

4References

8Claims

0Family size

Assignee

JPK INSTRUMENTS AG · DE

Inventors

Torsten Müller · Berlin, DE
Kathryn Anne Poole · Berlin, DE
Detlef Knebel · Berlin, DE
Torsten Jähnke · Berlin, DE

Key dates

Filing date	Jul 24, 2008
Grant date	Nov 25, 2014
Priority date	—
Expiry date	May 1, 2029

Classification

Technology area (CPC G)Physics
CPC primaryG01N2021/6482
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

The invention relates to a method for the combined analysis of a sample with objects to be analyzed, in particular a sample with biological objects, in which measurement results for one or more of the objects to be analyzed in the sample are obtained by analyzing the one or more objects to be analyzed by an imaging method of measurement, probe-microscopic measurement results are obtained for the one or more objects to be analyzed by analyzing the one or more objects to be analyzed by a probe-microscopic method of measurement, and the measurement results and the probe-microscopic measurement results are assigned to one another, after optional prior intermediate processing. Furthermore, the invention relates to an apparatus for carrying out combined analysis of a sample with objects to be investigated, in particular a sample with biological objects.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.