Modeling multi-patterning variability with statistical timing

US8949765B2 · kind B2 · utility

Assignee

• International Business Machines Corporation · US

Inventors

• Nathan C. Buck · Underhill, US
• Brian M. Dreibelbis · Underhill, US
• John P. Dubuque · Jericho, US
• Eric A. Foreman · Saint Albans, US
• Peter A. Habitz · South Burlington, US
• David J. Hathaway · Underhill Center, US
• Jeffrey G. Hemmett · South Burlington, US
• Natesan Venkateswaran · Hopewell Junction, US
• Chandramouli Visweswariah · Croton-on-Hudson, US
• Vladimir Zolotov · Putnam Valley, US

Key dates

• Filing date: Dec 23, 2013
• Grant date: Feb 3, 2015
• Expiry date: Dec 23, 2033

Classification

• Technology area (CPC G): Physics
• CPC primary: G06F2119/18
• WIPO field: Computer technology
• WIPO sector: Electrical engineering

Abstract

Systems and methods for modeling multi-patterning variability with statistical timing analysis during IC fabrication are described. The method may be provided implemented in a computer infrastructure having computer executable code tangibly embodied on a computer readable storage medium having programming instructions operable to define at least one source of variation in an integrated circuit design. The programming instructions further operable to model the at least one source of variation for at least two patterns in at least one level of the integrated circuit design as at least two sources of variability respectively.