Patent · US Active

Dense chevron finFET and method of manufacturing same

US8963294B2 · kind B2 · utility

0Cited by
7References
14Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 19, 2007
Grant dateFeb 24, 2015
Priority date
Expiry dateFeb 16, 2033

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D86/215

Abstract

A method, structure and alignment procedure, for forming a finFET. The method including, defining a first fin of the finFET with a first mask and defining a second fin of the finFET with a second mask. The structure including integral first and second fins of single-crystal semiconductor material and longitudinal axes of the first and second fins aligned in the same crystal direction but offset from each other. The alignment procedure including simultaneously aligning alignment marks on a gate mask to alignment targets formed separately by a first masked used to define the first fin and a second mask used to define the second fin.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.