Patent · US Active

ReRAM cells including TaXSiYN embedded resistors

US8969129B2 · kind B2 · utility

0Cited by
2References
20Claims
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Key dates

Filing dateAug 20, 2014
Grant dateMar 3, 2015
Priority date
Expiry dateAug 20, 2034

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10B63/80
  • WIPO fieldSurface technology, coating
  • WIPO sectorChemistry

Abstract

Provided are resistive random access memory (ReRAM) cells and methods of fabricating thereof. A ReRAM cell includes an embedded resistor and a resistive switching layer connected in series with this resistor. The resistor is configured to prevent over-programming of the cell by limiting electrical currents through the resistive switching layer. Unlike the resistive switching layer, which changes its resistance in order to store data, the embedded resistor maintains a substantially constant resistance during operation of the cell. The embedded resistor is formed from tantalum nitride and silicon nitride. The atomic ratio of tantalum and silicon may be specifically selected to yield resistors with desired densities and resistivities as well as ability to remain amorphous when subjected to various annealing conditions. The embedded resistor may also function as a diffusion barrier layer and prevent migration of components between one of the electrodes and the resistive switching layer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.