Apparatus and method for detecting a state of a deposition apparatus
US8980071B2 · kind B2 · utility
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11Claims
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Key dates
| Filing date | Aug 27, 2010 |
| Grant date | Mar 17, 2015 |
| Priority date | — |
| Expiry date | Apr 2, 2031 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J37/3444
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
Apparatuses for deposition of one or more layers. In one aspect, an apparatus for deposition of one or more layers includes an anode; a cathode; a vacuum chamber including the anode and the cathode; a sensor configured to detect an electric potential between a section of the at least one anode and a section of the chamber. Furthermore, methods to monitor a device for deposition of one or more layers are also described.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.