Patent · US Active

Method of fabrication of through-substrate vias

US8987137B2 · kind B2 · utility

24Cited by
4References
18Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 16, 2010
Grant dateMar 24, 2015
Priority date
Expiry dateOct 5, 2033

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2225/06541
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method of manufacturing a through-substrate-via structure. The method comprises providing a substrate having a front-side and an opposite back-side. A through-substrate via opening is formed in the front-side of the substrate. The through-substrate-via opening does not penetrate an outer surface of the back-side of the substrate. The through-substrate-via opening is filled with a solid fill material. Portions of the substrate from the outer surface of the back-side of the substrate are removed to thereby expose the fill material. At least portions of the exposed fill material are removed to form a back-side through-substrate via opening that traverses an entire thickness of the substrate. The back-side through-substrate via opening is filled with an electrically conductive material.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.