Transistors having a gate comprising a titanium nitride layer
US9000596B2 · kind B2 · utility
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7Claims
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Key dates
| Filing date | Jun 22, 2012 |
| Grant date | Apr 7, 2015 |
| Priority date | — |
| Expiry date | Oct 9, 2032 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10D64/667
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
A MOS transistor having a gate insulator including a dielectric of high permittivity and a conductive layer including a TiN layer, wherein the nitrogen composition in the TiN layer is sub-stoichiometric in its lower portion and progressively increases to a stoichiometric composition in its upper portion.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.