Inventor · Le Versoud, FR

Pierre Caubet

16Patents
3h-index
12Co-inventors
53Inventor score

Filing activity: Sep 6, 2005 → May 22, 2017

Most-cited inventions

PatentTitleAreaCited byStatus
US7601636B2 Implementation of a metal barrier in an integrated electronic circuit Electricity 52 Active
US7851915B2 Electronic component comprising a titanium carbonitride (TiCN) barrier layer and process of making the same Electricity 4 Active
US9691871B1 Process for forming a layer of equiaxed titanium nitride and a MOSFET device having a metal gate electrode including a layer of equiaxed titanium nitride Electricity 3 Active
US7667173B2 Integrated electrooptic system Physics 1 Active
US8013284B2 Integrated electrooptic system Physics 1 Active
US9257518B2 Method for producing a metal-gate MOS transistor, in particular a PMOS transistor, and corresponding integrated circuit Electricity 1 Active
US9029254B2 Method for depositing a low-diffusion TiAlN layer and insulated gate comprising such a layer Electricity 0 Active
US10211059B2 Process for forming a layer of equiaxed titanium nitride and a MOSFET device having a metal gate electrode including a layer of equiaxed titanium nitride Electricity 0 Active
US9953837B2 Transistor having a gate comprising a titanium nitride layer and method for depositing this layer Electricity 0 Active
US8018062B2 Production of a self-aligned CuSiN barrier Electricity 0 Active
US8053871B2 Implementation of a metal barrier in an integrated electronic circuit Electricity 0 Active
US9530489B2 Optoelectronic device, in particular memory device Physics 0 Active
US9000596B2 Transistors having a gate comprising a titanium nitride layer Electricity 0 Active
US7531447B2 Process for forming integrated circuit comprising copper lines Electricity 0 Expired
US7687399B2 Production of a self-aligned CuSiN barrier Electricity 0 Active
US9536599B1 Optoelectronic device, in particular memory device Physics 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.