Solid state drive tester
US9015545B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 19, 2013 |
| Grant date | Apr 21, 2015 |
| Priority date | — |
| Expiry date | Nov 11, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2029/0401
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Disclosed is a solid state drive tester which divides the functions of generating and comparing test pattern data and Frame Information Structure (FIS) data with each other into each other to implement the functions as separate logics, so that entire test time is decreased by reducing load of a processor. The solid state drive tester includes a host terminal for receiving a test condition for testing a storage from a user, and a test control unit creating a test pattern corresponding to the test condition, and adaptively selecting an interface according to an interface type of the storage to be tested to test the storage using the test pattern, wherein the test control unit is divided into a control module for controlling the test of the storage and a test execution module for practically executing the test in hardware to test a plurality of storages in real time.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.