Inventor · Yongin-si, KR

Hyo Jin Oh

9Patents
3h-index
20Co-inventors
53Inventor score

Filing activity: Nov 22, 2000 → Sep 4, 2015

Most-cited inventions

PatentTitleAreaCited byStatus
US6486651B1 Integrated circuit devices having a delay locked loop that is configurable for high-frequency operation during test and methods of operating same Physics 18 Expired
US6788596B2 Failed cell address programming circuit and method for programming failed cell address Physics 9 Expired
US9171643B2 Solid state drive tester Physics 5 Active
US9245613B2 Storage interface apparatus for solid state drive tester Physics 1 Active
US9153345B2 Error generating apparatus for solid state drive tester Physics 1 Active
US7867437B2 Method of manufacture Ni-doped TiO2 nanotube-shaped powder and sheet film comprising the same Emerging Cross-Sectional Technologies 0 Active
US9015545B2 Solid state drive tester Physics 0 Active
US10060969B2 Test board unit and apparatus for testing a semiconductor chip including the same Physics 0 Active
US9371430B2 Porous film with high hardness and a low dielectric constant and preparation method thereof Electricity 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.