Method for optimizing observed image classification criterion and image classification apparatus
US9020237B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 13, 2011 |
| Grant date | Apr 28, 2015 |
| Priority date | — |
| Expiry date | Dec 26, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30148
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A first object is to use both ADC (automatic defect classification) and MDC (manual defect classification) and reduce the amount of MDC operation. A second object is to prevent a DOI (defect of interest) from being missed.The first object is achieved by displaying judgment information on a screen. The judgment information is necessary when part of the classification is performed by ADC and part of the classification is performed by MDC and used to judge which classification is used, ADC or MDC. In the display operation, ADC classification results and MDC classification results are also displayed in the form of matrix. Further, a missed DOI rate is calculated for each classification threshold used in the defect classification and displayed on the screen.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.