Patent · US Active

Pattern forming method

US9023225B2 · kind B2 · utility

2Cited by
0References
11Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 26, 2013
Grant dateMay 5, 2015
Priority date
Expiry dateSep 26, 2033

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB81C2201/0149
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A pattern forming method includes forming a pattern forming material film on a substrate as an etching target film, the pattern forming material film having an exposing section that has porosity upon exposure and a non-exposing section, patterning and exposing the pattern forming material film for the exposing section to have the porosity, selectively infiltrating a filling material into voids of the exposing section to reinforce the exposing section, and removing the non-exposing section of the pattern forming material film by dry etching to form a predetermined pattern.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.