Kenichi Oyama
16Patents
5h-index
32Co-inventors
66Inventor score
Filing activity: Feb 19, 1993 → May 17, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5929479A | Floating gate type non-volatile semiconductor memory for storing multi-value information | Electricity | 178 | Expired |
| US5327385A | Method of erasure for a non-volatile semiconductor memory device | Physics | 20 | Expired |
| US5691552A | Nonvolatile semiconductor memory formed with silicon-on-insulator structure | Electricity | 16 | Expired |
| US9418860B2 | Use of topography to direct assembly of block copolymers in grapho-epitaxial applications | Electricity | 10 | Active |
| US7094994B2 | Heat treatment apparatus and method of semiconductor wafer | Electricity | 7 | Expired |
| US6013552A | Method of manufacturing a split-gate flash memory cell | Electricity | 3 | Expired |
| US9023225B2 | Pattern forming method | Performing Operations; Transporting | 2 | Active |
| US11444511B2 | Vibration damping device and electrically driven actuator | Mechanical Engineering; Lighting; Heating | 1 | Active |
| US8383990B2 | Substrate transport apparatus and heat treatment apparatus | Electricity | 1 | Active |
| US10211050B2 | Method for photo-lithographic processing in semiconductor device manufacturing | Electricity | 1 | Active |
| US11694872B2 | Pattern enhancement using a gas cluster ion beam | Electricity | 0 | Active |
| US8687405B2 | Phase change memory and method for fabricating phase change memory | Physics | 0 | Active |
| US10317797B2 | Pattern forming method for forming a pattern | Electricity | 0 | Active |
| US12165848B2 | Substrate processing method, substrate processing apparatus, and method for producing nanowire or nanosheet transistor | Electricity | 0 | Active |
| US11450506B2 | Pattern enhancement using a gas cluster ion beam | Electricity | 0 | Active |
| US9459535B2 | Method of forming pattern | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.